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GST attended the Photonics West 2016

Publish Date 2016-03-16
On 16~18 February 2016, The Photonics West 2016 was held at Moscone center San Francisco, Global Sensor Technology (GST) attend this show with its full uncooled PFA detector range, including VOx and a-Si material detectors, metal, ceramic and Wafer Level Packaging detectors. The released Wafer Level Packaging detector on the show is of the GST latest technologies, remarkable small size, outstanding cost effective benefit, it is considered as the future of thermal imaging industry.

SPIE Photonics West Exhibition, the premier photonics and laser event. With more than 1,300 companies, this exhibition is the flagship event to find the latest products, tools, and applications for research or business needs.






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